Controlled variation of the information depth by angle dependent soft X-ray emission spectroscopy: A study on polycrystalline Cu(In,Ga)Se 2

1. Mönig, H.
2. Lauermann, I.
3. Grimm, A.
4. Camus, C.
5. Kaufmann, C.A.
6. Pistor, P.
7. Jung, Ch.
8. Kropp, T.
9. Lux-Steiner, M.C.
10. Fischer, Ch.-H.