Characterization of the silicon/fluoride solution interfaces by in-situ microwave reflectivity
- Natarajan, Arun
- Oskam, Gerko
- Oursler, Douglas A.
- Searson, Peter C.
Aktak:
Materials Research Society Symposium - Proceedings
ISSN: 0272-9172
Argitalpen urtea: 1997
Alea: 451
Orrialdeak: 197-202
Mota: Biltzar ekarpena