Characterization of the silicon/fluoride solution interfaces by in-situ microwave reflectivity
- Natarajan, Arun
- Oskam, Gerko
- Oursler, Douglas A.
- Searson, Peter C.
ISSN: 0272-9172
Année de publication: 1997
Volumen: 451
Pages: 197-202
Type: Communication dans un congrès