Computation and spectroelectrochemistry as complementary tools for the study of electrochemically induced charged defects in 4-[Bis(4-methylphenyl)amino]phenyl oligothiophenes as model systems for hole-transporting materials
- Casado, J.
- Ruiz Delgado, M.C.
- Shirota, Y.
- Hernández, V.
- López Navarrete, J.T.
ISSN: 1089-5647
Datum der Publikation: 2003
Ausgabe: 107
Nummer: 12
Seiten: 2637-2644
Art: Artikel