Computation and spectroelectrochemistry as complementary tools for the study of electrochemically induced charged defects in 4-[Bis(4-methylphenyl)amino]phenyl oligothiophenes as model systems for hole-transporting materials

  1. Casado, J.
  2. Ruiz Delgado, M.C.
  3. Shirota, Y.
  4. Hernández, V.
  5. López Navarrete, J.T.
Revue:
Journal of Physical Chemistry B

ISSN: 1089-5647

Année de publication: 2003

Volumen: 107

Número: 12

Pages: 2637-2644

Type: Article

DOI: 10.1021/JP022484M GOOGLE SCHOLAR