Copper diffusion in thin In 2S 3 layers investigated by Rutherford backscattering spectroscopy
- Juma, A.O.
- Pistor, P.
- Fengler, S.
- Dittrich, T.
- Wendler, E.
ISSN: 0040-6090
Argitalpen urtea: 2012
Alea: 520
Zenbakia: 22
Orrialdeak: 6740-6743
Mota: Artikulua