Copper diffusion in thin In 2S 3 layers investigated by Rutherford backscattering spectroscopy

  1. Juma, A.O.
  2. Pistor, P.
  3. Fengler, S.
  4. Dittrich, T.
  5. Wendler, E.
Revue:
Thin Solid Films

ISSN: 0040-6090

Année de publication: 2012

Volumen: 520

Número: 22

Pages: 6740-6743

Type: Article

DOI: 10.1016/J.TSF.2012.07.042 GOOGLE SCHOLAR
La source de données: Scopus