Advanced X-ray methods for chalcogenide thin film analysis
- Kötschau, I.M.
- Weber, A.
- Pistor, P.
- Lauermann, I.
- Fischer, Ch.-H.
- Schock, H.W.
ISSN: 0040-6090
Année de publication: 2007
Volumen: 515
Número: 15 SPEC. ISS.
Pages: 5992-5996
Type: Article