Statistically representative metrology of nanoparticles via unsupervised machine learning of tem images

  1. Wen, H.
  2. Luna-Romera, J.M.
  3. Riquelme, J.C.
  4. Dwyer, C.
  5. Chang, S.L.Y.
Zeitschrift:
Nanomaterials

ISSN: 2079-4991

Datum der Publikation: 2021

Ausgabe: 11

Nummer: 10

Art: Artikel

DOI: 10.3390/NANO11102706 GOOGLE SCHOLAR lock_openOpen Access editor
Datenquelle: Scopus