Statistically representative metrology of nanoparticles via unsupervised machine learning of tem images
- Wen, H.
- Luna-Romera, J.M.
- Riquelme, J.C.
- Dwyer, C.
- Chang, S.L.Y.
Aldizkaria:
Nanomaterials
ISSN: 2079-4991
Argitalpen urtea: 2021
Alea: 11
Zenbakia: 10
Mota: Artikulua
