Avalanche breakdown energy in silicon carbide junction field effect transistors

  1. Hinojosa, M.
  2. Bayne, S.
  3. Veliadis, V.
  4. Urciuoli, D.
Book Series:
Materials Science Forum

ISSN: 0255-5476

ISBN: 9783037854198

Year of publication: 2012

Volume: 717-720

Pages: 1025-1028

Type: Conference paper

DOI: 10.4028/WWW.SCIENTIFIC.NET/MSF.717-720.1025 GOOGLE SCHOLAR
Data source: Scopus