Analysis of the impedance response due to surface states at the semiconductor/solution interface

  1. Hoffmann, P.M.
  2. Oskam, G.
  3. Searson, P.C.
Aldizkaria:
Journal of Applied Physics

ISSN: 0021-8979

Argitalpen urtea: 1998

Alea: 83

Zenbakia: 8

Orrialdeak: 4309-4323

Mota: Artikulua

DOI: 10.1063/1.367191 GOOGLE SCHOLAR
Datuen iturria: Scopus