Analysis of the impedance response due to surface states at the semiconductor/solution interface

  1. Hoffmann, P.M.
  2. Oskam, G.
  3. Searson, P.C.
Revue:
Journal of Applied Physics

ISSN: 0021-8979

Année de publication: 1998

Volumen: 83

Número: 8

Pages: 4309-4323

Type: Article

DOI: 10.1063/1.367191 GOOGLE SCHOLAR
La source de données: Scopus