In situ measurements of interface states at silicon surfaces in fluoride solutions

  1. Oskam, G.
  2. Hoffmann, P.M.
  3. Searson, P.C.
Journal:
Physical Review Letters

ISSN: 1079-7114,  0031-9007

Year of publication: 1996

Volume: 76

Issue: 9

Pages: 1521-1524

Type: Article

DOI: 10.1103/PHYSREVLETT.76.1521 GOOGLE SCHOLAR
Data source: Scopus