In situ measurements of interface states at silicon surfaces in fluoride solutions
- Oskam, G.
- Hoffmann, P.M.
- Searson, P.C.
ISSN: 1079-7114, 0031-9007
Année de publication: 1996
Volumen: 76
Número: 9
Pages: 1521-1524
Type: Article
Revue:
Physical Review Letters