Tetrathiafulvalene-based materials for organic field effect transistors. Inspection of their semiconductor properties by means of molecular spectroscopy and quantum chemistry

  1. Casado, J.
  2. Zgierski, M.Z.
  3. Delgado, M.C.R.
  4. Navarrete, J.T.L.
  5. Mas-Torrent, M.
  6. Rovira, C.
Revista:
Journal of Physical Chemistry C

ISSN: 1932-7447,  1932-7455

Any de publicació: 2007

Volum: 111

Número: 27

Pàgines: 10110-10118

Tipus: Article

DOI: 10.1021/JP073148E GOOGLE SCHOLAR
Font de les dades: Scopus