Tetrathiafulvalene-based materials for organic field effect transistors. Inspection of their semiconductor properties by means of molecular spectroscopy and quantum chemistry

  1. Casado, J.
  2. Zgierski, M.Z.
  3. Delgado, M.C.R.
  4. Navarrete, J.T.L.
  5. Mas-Torrent, M.
  6. Rovira, C.
Revista:
Journal of Physical Chemistry C

ISSN: 1932-7447 1932-7455

Ano de publicación: 2007

Volume: 111

Número: 27

Páxinas: 10110-10118

Tipo: Artigo

DOI: 10.1021/JP073148E GOOGLE SCHOLAR