Tetrathiafulvalene-based materials for organic field effect transistors. Inspection of their semiconductor properties by means of molecular spectroscopy and quantum chemistry

  1. Casado, J.
  2. Zgierski, M.Z.
  3. Delgado, M.C.R.
  4. Navarrete, J.T.L.
  5. Mas-Torrent, M.
  6. Rovira, C.
Revue:
Journal of Physical Chemistry C

ISSN: 1932-7447 1932-7455

Année de publication: 2007

Volumen: 111

Número: 27

Pages: 10110-10118

Type: Article

DOI: 10.1021/JP073148E GOOGLE SCHOLAR