Tetrathiafulvalene-based materials for organic field effect transistors. Inspection of their semiconductor properties by means of molecular spectroscopy and quantum chemistry

  1. Casado, J.
  2. Zgierski, M.Z.
  3. Delgado, M.C.R.
  4. Navarrete, J.T.L.
  5. Mas-Torrent, M.
  6. Rovira, C.
Zeitschrift:
Journal of Physical Chemistry C

ISSN: 1932-7447 1932-7455

Datum der Publikation: 2007

Ausgabe: 111

Nummer: 27

Seiten: 10110-10118

Art: Artikel

DOI: 10.1021/JP073148E GOOGLE SCHOLAR