Tetrathiafulvalene-based materials for organic field effect transistors. Inspection of their semiconductor properties by means of molecular spectroscopy and quantum chemistry

  1. Casado, J.
  2. Zgierski, M.Z.
  3. Delgado, M.C.R.
  4. Navarrete, J.T.L.
  5. Mas-Torrent, M.
  6. Rovira, C.
Journal:
Journal of Physical Chemistry C

ISSN: 1932-7447 1932-7455

Year of publication: 2007

Volume: 111

Issue: 27

Pages: 10110-10118

Type: Article

DOI: 10.1021/JP073148E GOOGLE SCHOLAR